This method is an extension of methods that perform bilinear, or quadratic inference, separately. Here, data are given by generalized transfer function values that can be sampled from the time-domain steady-state response. Although the dynamics characterizing the original model consist of general analytic nonlinearities, we rely on lifting techniques for equivalently embedding the original model into the quadratic-bilinear structure. Identification and Calibration, Electrical, Electronic and Power SystemsĪbstract: We propose a method for fitting quadratic-bilinear models from data.
Keywords: Model Reduction, Model Simplification and Optimization, Fitting Models to Real Processes, incl. Max Planck Institute for Dynamics of Complex Technical Systems In this paper, we present an interpolation approach to perform this task based on wafer level reliability models for the changes in the device behavior, as well as further aspects of mapping the observed behavior onto compact model parameters.Ī Framework for Fitting Quadratic-Bilinear Systems with Applications to Models of Electrical Circuits To this end, degradation models have to be established to transfer the observed changes in the transistor behavior into shifts of compact model parameters. By applying over-stress conditions to test transistors, these changes in the behavior can be observed in lab experiments, and they are typically described in terms of wafer level reliability models.Īging simulations investigate the effect of shifts in the transistor behavior on the performance of an integrated circuit in its operating life. Microscopic wear-out mechanisms cause the behavior of integrated transistors to change over time. The parametrization of these models is a complex task and requires expert knowledge. They employ compact models that describe the behavior of integrated transistors depending on technology details, geometry, bias conditions (voltages), etc.
MATHMOD PARAMETERS VERIFICATION
Identification and CalibrationĪbstract: Circuit simulations are an important step in the verification process of integrated circuits during design projects. Keywords: Electrical, Electronic and Power Systems, Fitting Models to Real Processes, incl. On the Interpolation from Transistor Figures of Merit to Compact Model Parametersįraunhofer Institute for Integrated Circuits IIS This gives rise to look also at the different meanings of the notion “model” in mathematics, computer and climate science. Overall, climate modeling and simulation is a highly interdisciplinary topic. Consequently, reliability of model results and their uncertainty are important issues. Vice versa, model results might be used to derive guidelines for political, social and economic strategies. Moreover, the recent discussions about climate change add some important aspects: The human influence on the climate system results in incorporation of economic and social models, in addition to the classical physical, chemical and biological basis.
Their evaluation on the computer requires a high computational effort. The climate system and, thus, also climate models are highly complex. In this talk, we discuss the underlying modeling principles, specific features and characteristics of climate models, and the resulting consequences for practical applications. Keywords: Numerical Simulation and Co-SimulationĪbstract: Climate research and climate predictions heavily rely on models.
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